Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul
Reliability analysis for integrated circuit amplifiers used in neural measurement systems
DATE, 2013.
@inproceedings{DATE-2013-HellwegeHPP,
acmid = "2485461",
author = "Nico Hellwege and Nils Heidmann and Dagmar Peters-Drolshagen and Steffen Paul",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "713--716",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{Reliability analysis for integrated circuit amplifiers used in neural measurement systems}",
year = 2013,
}











