Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul
Reliability analysis for integrated circuit amplifiers used in neural measurement systems
DATE, 2013.
@inproceedings{DATE-2013-HellwegeHPP, acmid = "2485461", author = "Nico Hellwege and Nils Heidmann and Dagmar Peters-Drolshagen and Steffen Paul", booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}", isbn = "978-1-4503-2153-2", pages = "713--716", publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}", title = "{Reliability analysis for integrated circuit amplifiers used in neural measurement systems}", year = 2013, }