@inproceedings{DATE-2013-HuangKCM,
	acmid         = "2485425",
	author        = "Ke Huang and Nathan Kupp and John M. Carulli Jr. and Yiorgos Makris",
	booktitle     = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-4503-2153-2",
	pages         = "553--558",
	publisher     = "{EDA Consortium San Jose, CA, USA / ACM DL}",
	title         = "{Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests}",
	year          = 2013,
}