David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, Subhasish Mitra
Overcoming post-silicon validation challenges through quick error detection (QED)
DATE, 2013.
@inproceedings{DATE-2013-LinHLFGHM,
acmid = "2485367",
author = "David Lin and Ted Hong and Yanjing Li and Farzan Fallah and Donald S. Gardner and Nagib Hakim and Subhasish Mitra",
booktitle = "{Proceedings of the 17th Conference on Design, Automation and Test in Europe}",
isbn = "978-1-4503-2153-2",
pages = "320--325",
publisher = "{EDA Consortium San Jose, CA, USA / ACM DL}",
title = "{Overcoming post-silicon validation challenges through quick error detection (QED)}",
year = 2013,
}