Dominik Erb, Karsten Scheibler, Matthias Sauer, Bernd Becker
Efficient SMT-based ATPG for interconnect open defects
DATE, 2014.
@inproceedings{DATE-2014-ErbSSB,
author = "Dominik Erb and Karsten Scheibler and Matthias Sauer and Bernd Becker",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.138",
pages = "1--6",
publisher = "{IEEE}",
title = "{Efficient SMT-based ATPG for interconnect open defects}",
year = 2014,
}