Travelled to:
2 × France
2 × Germany
Collaborated with:
B.Becker S.Reimer T.Schubert I.Polian A.Riefert M.S.Reorda D.Erb K.Scheibler R.Cantoro J.Jiang A.Czutro K.Gitina R.Wimmer C.Scholl L.M.Ciganda P.Bernardi
Talks about:
generat (3) test (3) longest (2) automat (2) effici (2) optim (2) path (2) base (2) interconnect (1) constraint (1)
Person: Matthias Sauer
DBLP: Sauer:Matthias
Contributed to:
Wrote 7 papers:
- DATE-2015-GitinaWRSSB #quantifier
- Solving DQBF through quantifier elimination (KG, RW, SR, MS, CS, BB), pp. 1617–1622.
- DATE-2015-RiefertCSRB #automation #generative #on the #source code
- On the automatic generation of SBST test programs for in-field test (AR, RC, MS, MSR, BB), pp. 1186–1191.
- DATE-2014-ErbSSB #fault #performance #smt
- Efficient SMT-based ATPG for interconnect open defects (DE, KS, MS, BB), pp. 1–6.
- DATE-2014-ReimerSSB #using
- Using MaxBMC for Pareto-optimal circuit initialization (SR, MS, TS, BB), pp. 1–6.
- DATE-2014-RiefertCSBRB #approach #automation #effectiveness #fault #functional #generative #testing
- An effective approach to automatic functional processor test generation for small-delay faults (AR, LMC, MS, PB, MSR, BB), pp. 1–6.
- DATE-2013-SauerRSPB #performance #satisfiability
- Efficient SAT-based dynamic compaction and relaxation for longest sensitizable paths (MS, SR, TS, IP, BB), pp. 448–453.
- DATE-2012-JiangSCBP #algorithm #constraints #generative #memory management #on the
- On the optimality of K longest path generation algorithm under memory constraints (JJ, MS, AC, BB, IP), pp. 418–423.