Travelled to:
1 × France
1 × Germany
Collaborated with:
B.Becker K.Scheibler M.Sauer S.Hillebrecht M.A.Kochte H.Wunderlich
Talks about:
base (2) interconnect (1) unknown (1) presenc (1) pattern (1) generat (1) effici (1) defect (1) accur (1) valu (1)
Person: Dominik Erb
DBLP: Erb:Dominik
Contributed to:
Wrote 2 papers:
- DATE-2014-ErbSSB #fault #performance #smt
- Efficient SMT-based ATPG for interconnect open defects (DE, KS, MS, BB), pp. 1–6.
- DATE-2013-HillebrechtKEWB #generative
- Accurate QBF-based test pattern generation in presence of unknown values (SH, MAK, DE, HJW, BB), pp. 436–441.