Yier Jin, Dean Sullivan
Real-time trust evaluation in integrated circuits
DATE, 2014.
@inproceedings{DATE-2014-JinS,
author = "Yier Jin and Dean Sullivan",
booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.7873/DATE.2014.104",
pages = "1--6",
publisher = "{IEEE}",
title = "{Real-time trust evaluation in integrated circuits}",
year = 2014,
}











