David Lin, Eswaran S, Sharad Kumar, Eric Rentschler, Subhasish Mitra
Quick error detection tests with fast runtimes for effective post-silicon validation and debug
DATE, 2015.
@inproceedings{DATE-2015-LinSKRM,
acmid = "2757083",
author = "David Lin and Eswaran S and Sharad Kumar and Eric Rentschler and Subhasish Mitra",
booktitle = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
isbn = "978-3-9815370-4-8",
pages = "1168--1173",
publisher = "{ACM}",
title = "{Quick error detection tests with fast runtimes for effective post-silicon validation and debug}",
year = 2015,
}