@inproceedings{DATE-2015-Weis0ESVGKW,
	acmid         = "2755865",
	author        = "Christian Weis and Matthias Jung and Peter Ehses and Cristiano Santos and Pascal Vivet and Sven Goossens and Martijn Koedam and Norbert Wehn",
	booktitle     = "{Proceedings of the 19th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-3-9815370-4-8",
	pages         = "495--500",
	publisher     = "{ACM}",
	title         = "{Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs}",
	year          = 2015,
}