Shengcheng Wang, Mehdi Baradaran Tahoori, Krishnendu Chakrabarty
Thermal-aware TSV repair for electromigration in 3D ICs
DATE, 2016.
@inproceedings{DATE-2016-WangTC,
author = "Shengcheng Wang and Mehdi Baradaran Tahoori and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
ee = "http://ieeexplore.ieee.org/document/7459509/",
isbn = "978-3-9815-3707-9",
pages = "1291--1296",
publisher = "{IEEE}",
title = "{Thermal-aware TSV repair for electromigration in 3D ICs}",
year = 2016,
}