Chih-Ang Chen, Sandeep K. Gupta
BIST Test Pattern Generators for Stuck-Open and Delay Testing
DATE, 1994.
@inproceedings{EDAC-1994-ChenG,
author = "Chih-Ang Chen and Sandeep K. Gupta",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "289--296",
publisher = "{IEEE Computer Society}",
title = "{BIST Test Pattern Generators for Stuck-Open and Delay Testing}",
year = 1994,
}