Arno Kunzmann, Frank Böhland
Gate-Delay Fault Test with Conventional Scan-Design
DATE, 1994.
@inproceedings{EDAC-1994-KunzmannB,
author = "Arno Kunzmann and Frank Böhland",
booktitle = "{Proceedings of the European Conference on Design Automation (EDAC), European Test Conference (ETC) and the European Event in ASIC Design (EUROASIC)}",
isbn = "0-8186-5410-4",
pages = "524--528",
publisher = "{IEEE Computer Society}",
title = "{Gate-Delay Fault Test with Conventional Scan-Design}",
year = 1994,
}