Subhrajit Bhattacharya, Sujit Dey, Bhaskar Sengupta
An RTL methodology to enable low overhead combinational testing
DATE, 1997.
@inproceedings{EDTC-1997-BhattacharyaDS,
author = "Subhrajit Bhattacharya and Sujit Dey and Bhaskar Sengupta",
booktitle = "{Proceedings of the Second European Design and Test Conference}",
doi = "10.1109/EDTC.1997.582349",
pages = "146--152",
publisher = "{IEEE}",
title = "{An RTL methodology to enable low overhead combinational testing}",
year = 1997,
}











