Rolf Drechsler, Harry Hengster, Horst Schäfer, Joachim Hartmann, Bernd Becker
Testability of 2-level AND/EXOR circuits
DATE, 1997.
@inproceedings{EDTC-1997-DrechslerHSHB,
author = "Rolf Drechsler and Harry Hengster and Horst Schäfer and Joachim Hartmann and Bernd Becker",
booktitle = "{Proceedings of the Second European Design and Test Conference}",
doi = "10.1109/EDTC.1997.582415",
pages = "548--553",
publisher = "{IEEE}",
title = "{Testability of 2-level AND/EXOR circuits}",
year = 1997,
}