Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
Sequential circuit test generation using dynamic state traversal
DATE, 1997.
@inproceedings{EDTC-1997-HsiaoRP,
author = "Michael S. Hsiao and Elizabeth M. Rudnick and Janak H. Patel",
booktitle = "{Proceedings of the Second European Design and Test Conference}",
doi = "10.1109/EDTC.1997.582325",
pages = "22--28",
publisher = "{IEEE}",
title = "{Sequential circuit test generation using dynamic state traversal}",
year = 1997,
}