Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel
Sequential circuit test generation using dynamic state traversal
DATE, 1997.
@inproceedings{EDTC-1997-HsiaoRP, author = "Michael S. Hsiao and Elizabeth M. Rudnick and Janak H. Patel", booktitle = "{Proceedings of the Second European Design and Test Conference}", doi = "10.1109/EDTC.1997.582325", pages = "22--28", publisher = "{IEEE}", title = "{Sequential circuit test generation using dynamic state traversal}", year = 1997, }