Zhouyuan Huo, Feiping Nie, Heng Huang
Robust and Effective Metric Learning Using Capped Trace Norm: Metric Learning via Capped Trace Norm
KDD, 2016.
@inproceedings{KDD-2016-HuoNH,
author = "Zhouyuan Huo and Feiping Nie and Heng Huang",
booktitle = "{Proceedings of the 22nd International Conference on Knowledge Discovery and Data Mining}",
doi = "10.1145/2939672.2939853",
isbn = "978-1-4503-4232-2",
pages = "1605--1614",
publisher = "{ACM}",
title = "{Robust and Effective Metric Learning Using Capped Trace Norm: Metric Learning via Capped Trace Norm}",
year = 2016,
}
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