An evolutionary algorithm for reducing integrated-circuit test application time
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Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero
An evolutionary algorithm for reducing integrated-circuit test application time
SAC, 2002.

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@inproceedings{SAC-2002-CornoRS,
	author        = "Fulvio Corno and Matteo Sonza Reorda and Giovanni Squillero",
	booktitle     = "{Proceedings of the 17th Symposium on Applied Computing}",
	doi           = "10.1145/508791.508908",
	pages         = "608--612",
	publisher     = "{ACM}",
	title         = "{An evolutionary algorithm for reducing integrated-circuit test application time}",
	year          = 2002,
}

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