Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero
An evolutionary algorithm for reducing integrated-circuit test application time
SAC, 2002.
@inproceedings{SAC-2002-CornoRS,
author = "Fulvio Corno and Matteo Sonza Reorda and Giovanni Squillero",
booktitle = "{Proceedings of the 17th Symposium on Applied Computing}",
doi = "10.1145/508791.508908",
pages = "608--612",
publisher = "{ACM}",
title = "{An evolutionary algorithm for reducing integrated-circuit test application time}",
year = 2002,
}











