Travelled to:
1 × France
Collaborated with:
B.Yang S.Sarangi C.Liu
Talks about:
methodolog (1) reduct (1) captur (1) speed (1) power (1) droop (1) clock (1) test (1) scan (1) gate (1)
Person: Amit Sanghani
DBLP: Sanghani:Amit
Contributed to:
Wrote 1 papers:
- DATE-2011-YangSSL #reduction #testing
- A clock-gating based capture power droop reduction methodology for at-speed scan testing (BY, AS, SS, CL), pp. 197–203.