Travelled to:5 × USA
Collaborated with:R.Harjani W.Jiang J.Andrews X.Sun L.L.Kinney D.Sun N.J.Stessman
Talks about:test (4) analog (2) fault (2) differenti (1) dictionari (1) parametr (1) function (1) consumpt (1) compress (1) generat (1)
Person: Bapiraju Vinnakota
DBLP: Vinnakota:Bapiraju
Contributed to:
20041999199819951994Wrote 6 papers:
- DAC-2004-SunKV #taxonomy #testing
- Combining dictionary coding and LFSR reseeding for test data compression (XS, LLK, BV), pp. 944–947.
- DAC-1999-HarjaniV #fault #parametricity
- Digital Aetection of Analog Parametric Faults in SC Filters (RH, BV), pp. 772–777.
- DAC-1999-JiangV #energy #using
- IC Test Using the Energy Consumption Ratio (WJ, BV), pp. 976–981.
- DAC-1998-SunVJ #performance #verification
- Fast State Verification (DS, BV, WJ), pp. 619–624.
- DAC-1995-VinnakotaHS #design #difference
- System-Level Design for Test of Fully Differential Analog Circuits (BV, RH, NJS), pp. 450–454.
- DAC-1994-VinnakotaA #fault #functional #generative #testing
- Functional Test Generation for FSMs by Fault Extraction (BV, JA), pp. 712–715.