Travelled to:
1 × USA
Collaborated with:
∅
Talks about:
techniqu (1) recognit (1) bipolar (1) layout (1) devic (1) check (1) use (1) lsi (1)
Person: C. S. Chang
DBLP: Chang:C=_S=
Contributed to:
Wrote 1 papers:
- DAC-1979-Chang #layout #recognition #using
- LSI layout checking using bipolar device recognition technique (CSC), pp. 95–101.