Travelled to:3 × USA
Collaborated with:D.M.Wu E.K.Vida-Torku ∅
Talks about:circuit (2) multichip (1) qualiti (1) predict (1) coverag (1) justif (1) improv (1) effect (1) vogic (1) ratio (1)
Person: Charles E. Radke
DBLP: Radke:Charles_E=
Facilitated 2 volumes:
EdEdContributed to:
199119831969Wrote 3 papers:
- DAC-1991-WuR #effectiveness #evaluation
- Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits (DMW, CER), pp. 291–295.
- DAC-1983-Vida-TorkuR #fault #multi #quality
- Quality level and fault coverage for multichip modules (EKVT, CER), pp. 201–206.
- DAC-1969-Radke #predict
- A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios (CER), pp. 257–267.