Travelled to:1 × USA
Collaborated with:C.E.Radke
Talks about:circuit (1) effect (1) vogic (1) evalu (1) delay (1) vlsi (1) test (1) lssd (1) base (1)
Person: David M. Wu
DBLP: Wu:David_M=
Contributed to:
1991Wrote 1 papers:
- DAC-1991-WuR #effectiveness #evaluation
- Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits (DMW, CER), pp. 291–295.