Travelled to:1 × France
1 × Germany
Collaborated with:A.Bartolini L.Benini P.Vivet D.Dutoit R.Diversi A.Tilli
Talks about:thermal (2) identif (2) model (2) techniqu (1) compens (1) analysi (1) wideio (1) advanc (1) stack (1) squar (1)
Person: Francesco Beneventi
DBLP: Beneventi:Francesco
Contributed to:
20142013Wrote 2 papers:
- DATE-2014-BeneventiBVDB #analysis #identification #logic
- Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip (FB, AB, PV, DD, LB), pp. 1–4.
- DATE-2013-DiversiBTBB #identification
- SCC thermal model identification via advanced bias-compensated least-squares (RD, AB, AT, FB, LB), pp. 230–235.