Travelled to:2 × USA
Collaborated with:R.W.Brodersen A.M.Hill D.Kirkpatrick M.A.Lavin M.Koyanagi A.J.Strojwas M.Campbell V.Gerousis J.Hogan M.Levitt W.Ng D.Pramanik M.Templeton
Talks about:nanomet (1) target (1) design (1) yield (1) fault (1) when (1) what (1) next (1) miss (1) hurt (1)
Person: John Kibarian
DBLP: Kibarian:John
Contributed to:
20042002Wrote 2 papers:
- DAC-2004-StrojwasCGHKLNPT #fault #question
- When IC yield missed the target, who is at fault? (AJS, MC, VG, JH, JK, ML, WN, DP, MT), p. 80.
- DAC-2002-BrodersenHKKLK #design #question #what
- Nanometer design: what hurts next...? (RWB, AMH, JK, DK, MAL, MK), p. 242.