Travelled to:1 × Australia
1 × France
Collaborated with:R.d.Vries T.Zwemstra E.M.J.G.Bruls G.Wang Z.Houkes M.J.Korsten G.Ji
Talks about:methodolog (1) recognit (1) statist (1) quadric (1) extract (1) describ (1) convert (1) surfac (1) region (1) invari (1)
Person: Paul P. L. Regtien
DBLP: Regtien:Paul_P=_L=
Contributed to:
1998
1997Wrote 2 papers:
- ICPR-1998-WangHRKJ #3d #invariant #recognition #statistics
- A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition (GW, ZH, PPLR, MJK, GJ), pp. 668–672.
- EDTC-1997-VriesZBR #self
- Built-in self-test methodology for A/D converters (RdV, TZ, EMJGB, PPLR), pp. 353–358.