A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition
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Guoyu Wang, Zweitze Houkes, Paul P. L. Regtien, M. J. Korsten, Guangrong Ji
A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition
ICPR, 1998.

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@inproceedings{ICPR-1998-WangHRKJ,
	author        = "Guoyu Wang and Zweitze Houkes and Paul P. L. Regtien and M. J. Korsten and Guangrong Ji",
	booktitle     = "{Proceedings of the 14th International Conference on Pattern Recognition}",
	doi           = "10.1109/ICPR.1998.711232",
	isbn          = "0-8186-8512-3",
	pages         = "668--672",
	publisher     = "{IEEE Computer Society}",
	title         = "{A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition}",
	year          = 1998,
}

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