Travelled to:1 × Germany
1 × USA
Collaborated with:J.E.Nelson J.G.Brown R.D.(.Blanton T.Zanon N.Patil W.Maly
Talks about:neighborhood (1) distribut (1) multipl (1) extract (1) densiti (1) result (1) physic (1) detect (1) defect (1) wafer (1)
Person: Rao Desineni
DBLP: Desineni:Rao
Contributed to:
2006
2006Wrote 2 papers:
- DAC-2006-NelsonBDB #detection #multi #physics
- Multiple-detect ATPG based on physical neighborhoods (JEN, JGB, RD, RD(B), pp. 1099–1102.
- DATE-2006-NelsonZDBPMB #fault
- Extraction of defect density and size distributions from wafer sort test results (JEN, TZ, RD, JGB, NP, WM, RD(B), pp. 913–918.