Travelled to:1 × Germany
Collaborated with:J.E.Nelson T.Zanon R.Desineni J.G.Brown W.Maly R.D.(.Blanton
Talks about:distribut (1) extract (1) densiti (1) result (1) defect (1) wafer (1) test (1) sort (1) size (1)
Person: N. Patil
DBLP: Patil:N=
Contributed to:
2006Wrote 1 papers:
- DATE-2006-NelsonZDBPMB #fault
- Extraction of defect density and size distributions from wafer sort test results (JEN, TZ, RD, JGB, NP, WM, RD(B), pp. 913–918.