Travelled to:
1 × Germany
Collaborated with:
J.E.Nelson R.Desineni J.G.Brown N.Patil W.Maly R.D.(.Blanton
Talks about:
distribut (1) extract (1) densiti (1) result (1) defect (1) wafer (1) test (1) sort (1) size (1)
Person: Thomas Zanon
DBLP: Zanon:Thomas
Contributed to:
Wrote 1 papers:
- DATE-2006-NelsonZDBPMB #fault
- Extraction of defect density and size distributions from wafer sort test results (JEN, TZ, RD, JGB, NP, WM, RD(B), pp. 913–918.