Travelled to:
1 × Germany
Collaborated with:
H.Li X.Li
Talks about:
generat (1) scheme (1) faster (1) speed (1) delay (1) clock (1) than (1) test (1) chip (1)
Person: Songwei Pei
DBLP: Pei:Songwei
Contributed to:
Wrote 1 papers:
- DATE-2010-PeiLL #generative #testing
- An on-chip clock generation scheme for faster-than-at-speed delay testing (SP, HL, XL), pp. 1353–1356.