Travelled to:
2 × USA
Collaborated with:
N.Ahmed M.Tehranipoor
Talks about:
delay (3) test (2) transit (1) pattern (1) generat (1) voltag (1) suppli (1) screen (1) design (1) defect (1)
Person: Vinay Jayaram
DBLP: Jayaram:Vinay
Contributed to:
Wrote 2 papers:
- DAC-2007-AhmedTJ #design #fault #generative
- Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design (NA, MT, VJ), pp. 533–538.
- DAC-2006-AhmedTJ #fault
- Timing-based delay test for screening small delay defects (NA, MT, VJ), pp. 320–325.