Travelled to:
1 × Germany
2 × USA
Collaborated with:
M.Tehranipoor V.Jayaram M.H.Tehranipour M.Nourani
Talks about:
delay (3) test (3) transit (1) pattern (1) generat (1) voltag (1) suppli (1) signal (1) screen (1) integr (1)
Person: Nisar Ahmed
DBLP: Ahmed:Nisar
Contributed to:
Wrote 3 papers:
- DAC-2007-AhmedTJ #design #fault #generative
- Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design (NA, MT, VJ), pp. 533–538.
- DAC-2006-AhmedTJ #fault
- Timing-based delay test for screening small delay defects (NA, MT, VJ), pp. 320–325.
- DATE-2003-AhmedTN #testing
- Extending JTAG for Testing Signal Integrity in SoCs (NA, MHT, MN), pp. 10218–10223.