Prioritizing tests for fault localization through ambiguity group reduction
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Alberto González-Sanchez, Rui Abreu, Hans-Gerhard Groß, Arjan J. C. van Gemund
Prioritizing tests for fault localization through ambiguity group reduction
ASE, 2011.

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@inproceedings{ASE-2011-Gonzalez-SanchezAGG,
	author        = "Alberto González-Sanchez and Rui Abreu and Hans-Gerhard Groß and Arjan J. C. van Gemund",
	booktitle     = "{Proceedings of the 26th IEEE/ACM International Conference on Automated Software Engineering}",
	doi           = "10.1109/ASE.2011.6100153",
	isbn          = "978-1-4577-1638-6",
	pages         = "83--92",
	publisher     = "{IEEE}",
	title         = "{Prioritizing tests for fault localization through ambiguity group reduction}",
	year          = 2011,
}

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