Potential biases in bug localization: do they matter?
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Pavneet Singh Kochhar, Yuan Tian, David Lo
Potential biases in bug localization: do they matter?
ASE, 2014.

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@inproceedings{ASE-2014-KochharTL,
	author        = "Pavneet Singh Kochhar and Yuan Tian and David Lo",
	booktitle     = "{Proceedings of the 29th IEEE/ACM International Conference on Automated Software Engineering}",
	doi           = "10.1145/2642937.2642997",
	isbn          = "978-1-4503-3013-8",
	pages         = "803--814",
	publisher     = "{ACM}",
	title         = "{Potential biases in bug localization: do they matter?}",
	year          = 2014,
}

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