Pavneet Singh Kochhar, Yuan Tian, David Lo
Potential biases in bug localization: do they matter?
ASE, 2014.
@inproceedings{ASE-2014-KochharTL,
author = "Pavneet Singh Kochhar and Yuan Tian and David Lo",
booktitle = "{Proceedings of the 29th IEEE/ACM International Conference on Automated Software Engineering}",
doi = "10.1145/2642937.2642997",
isbn = "978-1-4503-3013-8",
pages = "803--814",
publisher = "{ACM}",
title = "{Potential biases in bug localization: do they matter?}",
year = 2014,
}











