A secure collaborative e-diagnostics framework for semiconductor factories
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Min-Hsiung Hung, Feng-Yi Hsu, Tsung-Li Wang, Fan-Tien Cheng, Robin Lai, Tina Huang
A secure collaborative e-diagnostics framework for semiconductor factories
CASE, 2005.

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@inproceedings{CASE-2005-HungHWCLH,
	author        = "Min-Hsiung Hung and Feng-Yi Hsu and Tsung-Li Wang and Fan-Tien Cheng and Robin Lai and Tina Huang",
	booktitle     = "{Proceedings of the First International Conference on Automation Science and Engineering}",
	doi           = "10.1109/COASE.2005.1506766",
	isbn          = "0-7803-9425-9",
	pages         = "185--190",
	publisher     = "{IEEE}",
	title         = "{A secure collaborative e-diagnostics framework for semiconductor factories}",
	year          = 2005,
}

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