Travelled to:1 × China
1 × India
1 × Italy
1 × Korea
1 × Sweden
1 × Taiwan
2 × Canada
3 × USA
Collaborated with:M.Hung H.C.Yang H.Huang Y.Lin J.Y.Chang W.Wu H.Tieng Y.Su C.Kao T.Lin Y.Hsieh Y.Li D.Zeng J.Chen C.Chen C.Wei Y.Chen J.Jian Min-Nan Wu C.Tu C.Chen S.Wang T.Q.Huy T.Tsai C.Chao Y.Huang T.Liao F.Chang Y.Lin R.Lin M.Hsieh F.Hsu T.Wang R.Lai T.Huang Yu-Yang Liu Wei-Lun Gao C.Lin Y.Tsai M.Chen
Talks about:virtual (12) metrolog (11) develop (9) scheme (9) cloud (8) machin (7) tool (7) industri (6) base (6) system (5)
Person: Fan-Tien Cheng
DBLP: Cheng:Fan=Tien
Contributed to:
2015201420132012201120102009200820072006200520162018Wrote 26 papers:
- CASE-2015-LiYTC #architecture #fault
- Extracting relevant features for diagnosing machine tool faults in cloud architecture (YYL, HCY, HT, FTC), pp. 1434–1439.
- CASE-2015-LinHWC #development #multitenancy #novel #tool support
- Development of a novel cloud-based multi-tenant model creation scheme for machine tools (YCL, MHH, CFW, FTC), pp. 1448–1449.
- CASE-2015-TiengYC #precise #tool support
- Total precision inspection of machine tools with virtual metrology (HT, HCY, FTC), pp. 1446–1447.
- CASE-2014-ChenLHLTCC #development #framework #industrial
- Development of Auto-scaling Cloud Manufacturing Framework for machine tool industry (CCC, YCL, MHH, CYL, YJT, MSC, FTC), pp. 893–898.
- CASE-2014-HungLHTC #development
- Development of a private cloud-based new-generation virtual metrology system (MHH, YCL, HCH, CCT, FTC), pp. 910–915.
- CASE-2014-TiengYHC #approach #multi #optimisation #process
- A multi-objective optimization approach for selecting key features of machining processes (HT, HCY, MHH, FTC), pp. 899–904.
- CASE-2013-ChenHCHW #automation #maintenance #predict
- Automatic baseline-sample-selection scheme for baseline predictive maintenance (CFC, YSH, FTC, HCH, SCW), pp. 183–188.
- CASE-2013-HungLHHYC #development #industrial
- Development of an advanced manufacturing cloud for machine tool industry based on AVM technology (MHH, YCL, HCH, MHH, HCY, FTC), pp. 189–194.
- CASE-2012-HsiehCY
- Virtual-metrology-based FDC scheme (YSH, FTC, HCY), pp. 80–85.
- CASE-2012-HungLHYC #development #industrial #monitoring
- Development of a cloud-computing-based equipment monitoring system for machine tool industry (MHH, YCL, TQH, HCY, FTC), pp. 962–967.
- CASE-2012-YangTCHC
- A dual-forecast scheme for production output with paired/unpaired WIP data (HCY, THT, CYC, MHH, FTC), pp. 581–586.
- CASE-2011-KaoCW #case study
- Preliminary study of run-to-run control utilizing virtual metrology with reliance index (CAK, FTC, WMW), pp. 256–261.
- CASE-2010-HungHYC #automation #development #framework #industrial
- Development of an automatic virtual metrology framework for TFT-LCD industry (MHH, HCH, HCY, FTC), pp. 879–884.
- CASE-2010-YangCHC
- Virtual production control system (HCY, YLC, MHH, FTC), pp. 984–989.
- CASE-2009-WuCLZCH
- Advanced studies of selection schemes for dual virtual-metrology outputs (WMW, FTC, THL, DLZ, JFC, MHH), pp. 421–426.
- CASE-2008-HuangHCLC #automation #design #implementation
- Automatic virtual metrology system design and implementation (YTH, HCH, FTC, TSL, FCC), pp. 223–229.
- CASE-2008-WuCZLC
- Developing a selection scheme for dual virtual-metrology outputs (WMW, FTC, DLZ, THL, JFC), pp. 230–235.
- CASE-2007-ChengHK #development
- Development of a Dual-Phase Virtual Metrology Scheme (FTC, HCH, CAK), pp. 270–275.
- CASE-2007-HuangSCJ #development #framework
- Development of a Generic Virtual Metrology Framework (HCH, YCS, FTC, JMJ), pp. 282–287.
- CASE-2007-SuLCW #algorithm #implementation
- Implementation Considerations of Various Virtual Metrology Algorithms (YCS, THL, FTC, WMW), pp. 276–281.
- CASE-2006-ChangC #industrial #multi
- Manufacturability of Multivariate Applications in the Semiconductor Industry (JYCC, FTC), pp. 230–235.
- CASE-2005-ChangC #industrial #requirements
- Engineering-chain requirements for semiconductor industry (JYCC, FTC), pp. 381–386.
- CASE-2005-HungHWCLH #collaboration #framework
- A secure collaborative e-diagnostics framework for semiconductor factories (MHH, FYH, TLW, FTC, RL, TH), pp. 185–190.
- CASE-2005-SuCHLL #design #implementation
- Design and implementation of an intelligent prognostics system (YCS, FTC, MHH, YCL, RCL), pp. 273–278.
- CASE-2016-YangLWC #architecture #hybrid #predict
- A hybrid tool life prediction scheme in cloud architecture (HCY, YYL, MNW, FTC), pp. 1160–1165.
- CASE-2018-LiuHLCGC
- A Cloud-based Pluggable Manufacturing Service Scheme for Smart Factory (YYL, MHH, YCL, CCC, WLG, FTC), pp. 1040–1045.