Wai Kuan Yip, K. G. Law, Wen Jau Lee
Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data
CASE, 2007.
@inproceedings{CASE-2007-YipLL, author = "Wai Kuan Yip and K. G. Law and Wen Jau Lee", booktitle = "{Proceedings of the Third International Conference on Automation Science and Engineering}", doi = "10.1109/COASE.2007.4341700", isbn = "978-1-4244-1154-2", pages = "478--483", publisher = "{IEEE}", title = "{Forecasting Final/Class Yield Based on Fabrication Process E-Test and Sort Data}", year = 2007, }