Fast image drift compensation in scanning electron microscope using image registration
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Naresh Marturi, Sounkalo Dembélé, Nadine Piat
Fast image drift compensation in scanning electron microscope using image registration
CASE, 2013.

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@inproceedings{CASE-2013-MarturiDP,
	author        = "Naresh Marturi and Sounkalo Dembélé and Nadine Piat",
	booktitle     = "{Proceedings of the Ninth International Conference on Automation Science and Engineering}",
	doi           = "10.1109/CoASE.2013.6653936",
	pages         = "807--812",
	publisher     = "{IEEE}",
	title         = "{Fast image drift compensation in scanning electron microscope using image registration}",
	year          = 2013,
}

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