Travelled to:
1 × USA
Collaborated with:
N.Marturi S.Dembélé
Talks about:
imag (2) microscop (1) electron (1) registr (1) compens (1) drift (1) scan (1) fast (1) use (1)
Person: Nadine Piat
DBLP: Piat:Nadine
Contributed to:
Wrote 1 papers:
- CASE-2013-MarturiDP #image #performance #using
- Fast image drift compensation in scanning electron microscope using image registration (NM, SD, NP), pp. 807–812.