Hamideh Rostami, Jakey Blue, Argon Chen, Claude Yugma
Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing
CASE, 2018.
@inproceedings{CASE-2018-RostamiBCY, author = "Hamideh Rostami and Jakey Blue and Argon Chen and Claude Yugma", booktitle = "{Proceedings of the 14th International Conference on Automation Science and Engineering}", doi = "10.1109/COASE.2018.8560435", isbn = "978-1-5386-3593-3", pages = "1316--1321", publisher = "{IEEE}", title = "{Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing}", year = 2018, }