Travelled to:1 × India
1 × Taiwan
1 × USA
Collaborated with:J.Blue L.Chiu S.Hsueh M.W.Brantley L.H.Lee C.Chen Hamideh Rostami C.Yugma
Talks about:sampl (2) optim (2) semiconductor (1) ultrasound (1) manufactur (1) stochast (1) metrolog (1) diagnosi (1) deterior (1) boundari (1)
Person: Argon Chen
DBLP: Chen:Argon
Contributed to:
2014200920082018Wrote 4 papers:
- CASE-2014-ChiuC #bound #detection #image
- A variance-reduction method for thyroid nodule boundary detection on ultrasound images (LYC, AC), pp. 681–685.
- CASE-2009-ChenHB
- Optimum sampling for track PEB CD Integrated Metrology (AC, SH, JB), pp. 439–442.
- CASE-2008-BrantleyLCC #design #empirical #optimisation #probability
- Optimal sampling in design of experiment for simulation-based stochastic optimization (MWB, LHL, CHC, AC), pp. 388–393.
- CASE-2018-RostamiBCY #modelling
- Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing (HR, JB, AC, CY), pp. 1316–1321.