The UK5000 — successful collaborative development of an integrated design system for a 5000 gate CMOS array with built-in test
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J. R. Grierson, B. Cosgrove, Daniel Richert, R. E. Halliwell, Harold Kirk, John C. Knight, John A. McLean, J. M. McGrail, C. O. Newton
The UK5000 — successful collaborative development of an integrated design system for a 5000 gate CMOS array with built-in test
DAC, 1983.

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@inproceedings{DAC-1983-GriersonCRHKKMMN,
	acmid         = "800736",
	author        = "J. R. Grierson and B. Cosgrove and Daniel Richert and R. E. Halliwell and Harold Kirk and John C. Knight and John A. McLean and J. M. McGrail and C. O. Newton",
	booktitle     = "{Proceedings of the 20th Design Automation Conference}",
	isbn          = "0-8186-0026-8",
	pages         = "629--636",
	publisher     = "{ACM/IEEE}",
	title         = "{The UK5000 — successful collaborative development of an integrated design system for a 5000 gate CMOS array with built-in test}",
	year          = 1983,
}

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