Daniel S. Barclay, James R. Armstrong
A heuristic chip-level test generation algorithm
DAC, 1986.
@inproceedings{DAC-1986-BarclayA,
author = "Daniel S. Barclay and James R. Armstrong",
booktitle = "{Proceedings of the 23rd Design Automation Conference}",
doi = "10.1145/318013.318054",
pages = "257--262",
publisher = "{IEEE Computer Society Press}",
title = "{A heuristic chip-level test generation algorithm}",
year = 1986,
}











