SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits
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Hyung Ki Lee, Dong Sam Ha
SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits
DAC, 1990.

DAC 1990
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@inproceedings{DAC-1990-LeeH,
	author        = "Hyung Ki Lee and Dong Sam Ha",
	booktitle     = "{Proceedings of the 27th Design Automation Conference}",
	doi           = "10.1145/123186.123432",
	isbn          = "0-89791-363-9",
	pages         = "660--666",
	publisher     = "{IEEE Computer Society Press}",
	title         = "{SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits}",
	year          = 1990,
}

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