Hyung Ki Lee, Dong Sam Ha
SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits
DAC, 1990.
@inproceedings{DAC-1990-LeeH, author = "Hyung Ki Lee and Dong Sam Ha", booktitle = "{Proceedings of the 27th Design Automation Conference}", doi = "10.1145/123186.123432", isbn = "0-89791-363-9", pages = "660--666", publisher = "{IEEE Computer Society Press}", title = "{SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits}", year = 1990, }