Hyung Ki Lee, Dong Sam Ha
SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits
DAC, 1990.
@inproceedings{DAC-1990-LeeH,
author = "Hyung Ki Lee and Dong Sam Ha",
booktitle = "{Proceedings of the 27th Design Automation Conference}",
doi = "10.1145/123186.123432",
isbn = "0-89791-363-9",
pages = "660--666",
publisher = "{IEEE Computer Society Press}",
title = "{SOPRANO: An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits}",
year = 1990,
}











