Wen Ching Wu, Chung-Len Lee
A Probabilistic Testability Measure for Delay Faults
DAC, 1991.
@inproceedings{DAC-1991-WuL,
author = "Wen Ching Wu and Chung-Len Lee",
booktitle = "{Proceedings of the 28th Design Automation Conference}",
doi = "10.1145/127601.127709",
isbn = "0-89791395-7",
pages = "440--445",
publisher = "{ACM}",
title = "{A Probabilistic Testability Measure for Delay Faults}",
year = 1991,
}











