Wen Ching Wu, Chung-Len Lee
A Probabilistic Testability Measure for Delay Faults
DAC, 1991.
@inproceedings{DAC-1991-WuL, author = "Wen Ching Wu and Chung-Len Lee", booktitle = "{Proceedings of the 28th Design Automation Conference}", doi = "10.1145/127601.127709", isbn = "0-89791395-7", pages = "440--445", publisher = "{ACM}", title = "{A Probabilistic Testability Measure for Delay Faults}", year = 1991, }