David M. Wu, Charles E. Radke
Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits
DAC, 1991.
@inproceedings{DAC-1991-WuR,
author = "David M. Wu and Charles E. Radke",
booktitle = "{Proceedings of the 28th Design Automation Conference}",
doi = "10.1145/127601.127683",
isbn = "0-89791395-7",
pages = "291--295",
publisher = "{ACM}",
title = "{Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits}",
year = 1991,
}