Kazuo Iwama, Kensuke Hino
Random Generation of Test Instances for Logic Optimizers
DAC, 1994.
@inproceedings{DAC-1994-IwamaH, author = "Kazuo Iwama and Kensuke Hino", booktitle = "{Proceedings of the 31st Design Automation Conference}", doi = "10.1145/196244.196452", isbn = "0-7803-1836-6", pages = "430--434", publisher = "{ACM Press}", title = "{Random Generation of Test Instances for Logic Optimizers}", year = 1994, }