Travelled to:1 × France
1 × USA
Collaborated with:K.Iwama H.Kurokawa S.Sawada
Talks about:random (2) benchmark (1) attribut (1) instanc (1) generat (1) control (1) circuit (1) optim (1) logic (1) test (1)
Person: Kensuke Hino
DBLP: Hino:Kensuke
Contributed to:
1997
1994Wrote 2 papers:
- EDTC-1997-IwamaHKS #benchmark #metric #random
- Random benchmark circuits with controlled attributes (KI, KH, HK, SS), pp. 90–97.
- DAC-1994-IwamaH #generative #logic #random
- Random Generation of Test Instances for Logic Optimizers (KI, KH), pp. 430–434.