Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann
Sequential Circuit Test Generation in a Genetic Algorithm Framework
DAC, 1994.
@inproceedings{DAC-1994-RudnickPGN,
author = "Elizabeth M. Rudnick and Janak H. Patel and Gary S. Greenstein and Thomas M. Niermann",
booktitle = "{Proceedings of the 31st Design Automation Conference}",
doi = "10.1145/196244.196619",
isbn = "0-7803-1836-6",
pages = "698--704",
publisher = "{ACM Press}",
title = "{Sequential Circuit Test Generation in a Genetic Algorithm Framework}",
year = 1994,
}