Travelled to:2 × USA
Collaborated with:J.H.Patel W.Cheng E.M.Rudnick G.S.Greenstein
Talks about:sequenti (2) circuit (2) framework (1) algorithm (1) generat (1) memori (1) effici (1) simul (1) proof (1) genet (1)
Person: Thomas M. Niermann
DBLP: Niermann:Thomas_M=
Contributed to:
19941990Wrote 2 papers:
- DAC-1994-RudnickPGN #algorithm #framework #generative #search-based #testing
- Sequential Circuit Test Generation in a Genetic Algorithm Framework (EMR, JHP, GSG, TMN), pp. 698–704.
- DAC-1990-NiermannCP #fault #memory management #named #performance #proving
- Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator (TMN, WTC, JHP), pp. 535–540.